|
|
|
||
|
Analysis of fine structure of diffraction patterns, phase analysis, analysis of various kinds of lattice imperfections, analysis of composition, determination of foil thickness, fundamental principles of image simulation and processing, employment of microdiffraction, weak beam and convergent beam electron diffraction techniques.
For undergraduate students of grade 4 and 5 and graduate students.
Last update: T_KFK (17.04.2002)
|
|
||
|
The subject is termianted by the credit. The credit is issued for the active participation at the seminar/tutorial and sucesfull passion of one or two written tests during the seminars. Last update: Janeček Miloš, prof. RNDr., CSc. (08.06.2019)
|
|
||
|
1. B. Smola: Transmisní elektronová mikroskopie. Skripta MFF UK, Státní pedagogické nakladatelství, Praha 1983. 2. L. Reimer: Transmission Electrom Microscopy. Springer Verlag, Berlín 1993. 3. J.W. Edington: Practical Electron Microscopy in Materials Science. ed. N.v. Philips Gloeilampenfabrieken, Eindhoven 1976. 4. I.M. Watt: The Principle and Practice of Electron Microscopy. Cambridge University Press, London 1985. 5. F. Jandoš, R. Říman, A. Gemperle: Využití moderních laboratorních metod v metalografii. Nakladatelství technické literatury, Praha 1985. 6. Williams D.B., Carter C.B. Transmission Electron Microscopy, Plenum Press, New York, 1996. Last update: T_KFK (17.03.2004)
|
|
||
|
Analysis of fine structure of diffraction patterns, phase analysis, analysis of various kinds of lattice imperfections, analysis of composition, determination of foil thickness, fundamental principles of image simulation and processing, employment of microdiffraction, weak beam and convergent beam electron diffraction techniques. For undergraduate students of grade 4 and 5 and graduate students. Last update: T_KFK (17.03.2004)
|