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Last update: T_KFES (23.05.2001)
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Last update: Mgr. Kateřina Mikšová (12.05.2022)
The condition for completing the course is successful completion of a credit paper and an oral exam. The paper consists of solving one task similar to those solved in the exercise. Successful acquisition of the credit is conditioned by successful completion of the task. |
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Last update: doc. RNDr. Stanislav Daniš, Ph.D. (30.04.2019)
Pietsch, U., Holý, V., Baumbach, T., High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures, Springer-Verlag New York 2004
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Last update: doc. RNDr. Stanislav Daniš, Ph.D. (10.10.2017)
Závěrečná zkouška sestává jen z ústní části. Požadavky k ústní zkoušce odpovídají sylabu předmětu v rozsahu jakým byl odpřednášen. Získání zápočtu NENÍ podmínkou účasti na ústní zkoušce. |
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Last update: T_KFES (26.05.2003)
1. Accuracy in diffraction experiment - instrumental aberrations, microstructural parameters, geometrical factors, sample transparency, absorption of x-rays, surface roughness, primary and secondary extinction, preferred orientation of crystallites
2. Dynamical effects in crystals.Thermal vibrations, diffusion, chemical inhomogeneity
3. Short and long range ordering - diffractional study of local arrangement at phase transition, x-ray diffraction on structures with large periodicity (multilayers, superconductors) high and low angle diffraction, reflectivity (optical theory, DBWA)
4. Experimental methods of determining the short range orderining - EXAFS, diffuse scattering
5. Computional methods in applied structural analysis - simulating of diffraction pattern (Lazy Pulverix), refinement of real crystal structure (the Rietveld method), deconvolution. Determinination of thin film, multilayer and superconductor structure parameters (SUPREX) |