Transmission electron microscopy methods for materials science - MC260P151

• Title: Transmission electron microscopy methods for materials science
• Czech title: Metody transmisní elektronové mikroskopie pro materiálové vědy
• Guaranteed by: Department of Physical and Macromolecular Chemistry (31-260)
• Faculty: Faculty of Science
• Actual: from 2023
• Semester: summer
• E-Credits: 3
• Examination process: summer s.:oral
• Hours per week, examination: summer s.:1/1, C+Ex [HT]
• Capacity: unlimited
• Min. number of students: unlimited
• 4EU+: no
• Virtual mobility / capacity: no
• State of the course: taught
• Language: English
• Note: enabled for web enrollment
• Guarantor: Michal Mazur, Ph.D.
• Teacher(s): Michal Mazur, Ph.D.

Annotation

This course will cover the fundamentals of transmission electron microscopy (TEM) in materials sciences.
Graduating this course, students will be able to understand research where TEM has been used and have the
necessary theoretical basis for taking a practical training on the TEM (which is also a part of this course).

TEM provides access to structural and chemical information from the micrometer to the sub-angstrom scale.
Sample can be analyzed towards the crystallinity, grain structure, size, and defects, and the chemical composition.
The crystal lattice can be imaged with atomic resolution, allowing observation of grain boundaries and interfaces. It
is one of the most direct structural analysis methods for studying nanoparticles. A comprehensive introduction to
transmission electron microscopy will be supplemented with practical exercise on use of the microscope, data
processing, and image analysis.

Recommended background: Basics of crystallography and diffraction, more advanced crystallography and solid-
state physics are of advantage.

Last update: Ušelová Kateřina, RNDr., Ph.D. (28.03.2023)

Literature

[1] Transmission Electron Microscopy: A Textbook for Materials Science. Authors: Williams, David B. and

Carter, C. Barry. https://www.springer.com/gp/book/9780387765006

[2] Transmission Electron Microscopy: Physics of Image Formation; Authors: Reimer, Ludwig, Kohl,

Helmut. http://www.springer.com/us/book/9780387400938

Last update: Ušelová Kateřina, RNDr., Ph.D. (23.03.2023)

Requirements to the exam

Single-choice test consisting of 30 questions based on the material covered by the lectures

(60% right answers in a pass grade) followed by oral exam in the scope of the subject. The exam

takes place in present form.

Last update: Ušelová Kateřina, RNDr., Ph.D. (23.03.2023)

Syllabus

Sylabus:

1. Introduction

2. History of TEM

3. Lens aberrations

4. TEM machine

5. Diffraction

6. Reciprocal lattice

7. Scattering

8. Dynamical effects

9. Image formation

10. Pahe contrast, Z-contrast

11. HRTEM

12. STEM

13. ED methods

14. cRED

15. Use of TEM methods for your research

Last update: Ušelová Kateřina, RNDr., Ph.D. (23.03.2023)