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Last update: T_KFES (23.05.2001)
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Last update: prof. RNDr. Radomír Kužel, CSc. (12.05.2022)
Oral and written examination. Written aprt consists of solution of simple problem non-requiring long calculation (max. 30 min). Oral part follows and it is usually about 45 min. |
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Last update: RNDr. Pavel Zakouřil, Ph.D. (05.08.2002)
články v časopisechu a kol. : Analytical Techniques for Thin Films New York 1986
články v časopisech |
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Last update: prof. RNDr. Václav Holý, CSc. (06.10.2017)
Požadavky zkoušky odpovídají skutečně odpřednášené části sylabu. |
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Last update: T_KFES (26.05.2003)
A. SURFACE STRUCTURE
Importance of surface structure study. Surface relaxation and reconstruction. 2D Bravais lattices. Wood´s notation. Matrix notation. Steps and facets. Surface structures. Diffraction on 2D lattice. Ewald construction. Diffracting beam description.
B. METHODS OF STUDY OF SURFACE STRUCTURES AND THIN FILMS
Methods of clean surface preparation.
1. Diffraction of electrons and positrons.
LEED - basic characteristics and principle, experimental setup, electron scattering in crystal, mutliple scattering, surface lattice defects, phase transitions.
Thermal vibrations. Debye-Waller factors. Anisotropic vibrations.
MEED, RHEED, LEPD - principles and applications.
2. Scattering of atoms and ions.
Diffraction of atoms - interaction of atoms with surface, experimental setup, applications (charge density distribution, hydrogen chemisorption, reconstruction, surfaces of insulators, incommensurate structures)
Ion scattering (ISS) - LEIS, MEIS, HEIS (RBS). Principles, peak intensity, study of atomic displacements, reconstructed and relaxed surface, adsorbates, interfaces, surface melting)
3. Spectroscopic methods
4. Some other methods (ESDIAD, TSD, HREELS, ...)
5. Microscopy of surfaces
6. X-ray diffraction
Double- and triple crystal diffractometry (diffraction in perfect crystals, epitaxial layers - strains, composition, depth profiling)
Glancing angle diffraction - total reflection, amorphous thin films, implanted films, surfaces. GID - grazin angle diffraction.
Standing-wave method (secondary radiation, registration of photoelectrons, fotoemission, fluorescence, Compton scattering)
Study of polycrystalline thin films. Structural pecularities of thin films, mechanical properties. Conventional powder diffraction (pahse analysis, texture, stress, strain, crystallite size). Stress determination. Low-angle diffraction. Examples, hard coatings. |