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Last update: T_KMF (18.05.2001)
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Last update: RNDr. Jan Prokeš, CSc. (13.06.2019)
F. Kremer, A. Schönhals (eds.): Broadband Dielectric Spectroscopy, Springer 2003, part 2 (also parts 3, 12 a 13) J.P. Rundt, J.J. Fitzgerald (eds.): Dielectric Spectroscopy of Polymeric Materials, American Chemical Society 1997, part 2 M. Honda: The Impedance Measurement Handbook, Yokogawa-Hewlett-Packard LTD. 1989 D.K. Schroder: Semiconductor Material and Device Characterization, John Wiley & Sons, Inc. 1998, parts 1.2, 2.2, 2.5 Keithley: Low Level Measurements Handbook, 5th edition, Keithely Instruments, Inc. 1998 |
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Last update: RNDr. Jan Prokeš, CSc. (13.06.2019)
The exam is oral. Requirements for the exam correspond to the syllabus of the course to the extent presented at the lecture. |
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Last update: RNDr. Jan Prokeš, CSc. (13.06.2019)
1. Impedance measurements Influence of parasitic values – real, effective and indicated value; survey of measurement methods; autobalancing bridge principle; ways of connection the sample; parasitic values elimination, calibration and compensation; examples of the measurements and devices. 2. Low voltage, low current and high resistance measurements Description of electrometers, ammeters and nanovoltmeters; instruments accuracy; influence of the parasitic values; shielding, guarding, triax connection, noise, drift. 3. Transport properties measurements Problems with contacts; general rules of measurements; determination of the charge carrier concentration, electrical conductivity, Hall effect, thermoelectric power, heat transport. 4. Measurement of nonequilibrium carriers lifetime Lifetime, diffusion length and surface recombination determination. 5. Parameters characterization of defects in semiconductors Terms definition; survey of experimental methods; description of capacitance methods, their advantages, practical usage. 6. Problems of noise Types of noise, source of noise; basic description; methods of noise measurements. |