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Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (08.02.2022)
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Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (05.03.2019)
Egerton, R.F. Physical Principles of Electron Microscopy, Springer Verlag 2007 Meyer, E., Hug, H.J., Bennewitz, R. Scanning Probe Microscopy, Spinger Verlag 2004 Zemb, T., Lindner, P. (Eds.) Neutrons, X-rays and Light. Scattering Methods Applied to Soft Condensed Matter, North Holland 2002 |
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Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (04.02.2022)
Oral exam |
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Last update: prof. RNDr. Miroslav Štěpánek, Ph.D. (04.02.2022)
1. Electron microscopy Basic principles of electron microscopy imaging, magnification, point resolution, contrast, chromatic and spherical aberration. Transmission and scanning electron microscopy, detection in SEM/STEM methods, interaction of electrons with the sample, EDS and EELS techniques. Sample preparation, cryogenic transmission electron microscopy 2. Scanning probe microscopy Basic principles of SPM imaging, atomic force microscopy in contact, semicontact and noncontact mode, scanning tunelling microscopy 3. Scattering methods Introduction to scattering theory, scattering vector, scattering length and scattering cross-section, form factor and structure factor. Analysis of scattering curves. Dynamic light scattering, intensity autocorrelation function, translational and rotational diffusion coefficient from DLS. Ligh, X-ray and neutron scattering measurements - radiation sources, detection and calibration. |