  Thesis title |
Year of announcement |
Year of defence |
Thesis type | Thesis discipline | Supervisor |
Author |
Announced |
Assigned | Department | Faculty | |
 |
Study of the semiconductor surface roughness by means of an interferometer profiler | 2009/2010 | project | FOF | doc. RNDr. Pavel Moravec, CSc. | 05.11.2009 | Ne | Fyzikální ústav UK (32-FUUK) | MFF | ||
|
Electric contacts in CdTe single crystals | 2009/2010 | Bachelor's thesis | FOF | doc. RNDr. Pavel Moravec, CSc. | 30.09.2009 | Ne | Fyzikální ústav UK (32-FUUK) | MFF | ||
|
Electric contacts in CdTe single crystals | 2010/2011 | Bachelor's thesis | FOF | doc. RNDr. Pavel Moravec, CSc. | 01.10.2010 | Ne | Fyzikální ústav UK (32-FUUK) | MFF | ||
|
Surface Characterization of Semiconductor Substrates for Optoelectronic Applications | 2006/2007 | Bachelor's thesis | FOF | doc. RNDr. Pavel Moravec, CSc. | 01.10.2006 | Ne | Fyzikální ústav UK (32-FUUK) | MFF | ||
|
Surface Characterization of Semiconductor Substrates for Optoelectronic Applications | 2008/2009 | Bachelor's thesis | FOF | doc. RNDr. Pavel Moravec, CSc. | 03.10.2008 | Ne | Fyzikální ústav UK (32-FUUK) | MFF | ||
|
Surface Characterization of Semiconductor Substrates for Optoelectronic Applications | 2007/2008 | Bachelor's thesis | FOF | doc. RNDr. Pavel Moravec, CSc. | 05.10.2007 | Ne | Fyzikální ústav UK (32-FUUK) | MFF |
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