  Thesis title |
Year of announcement |
Year of defence |
Thesis type | Thesis discipline | Supervisor |
Author |
Announced |
Assigned | Department | Faculty | |
 |
XRD line profile analysis by total powder pattern fitting | 2017/2018 | Bachelor's thesis | FOF | prof. RNDr. Radomír Kužel, CSc. | 25.03.2015 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | ||
|
X-ray diffraction study of Ti-O-N thin films | 2007/2008 | Bachelor's thesis | prof. RNDr. Radomír Kužel, CSc. | 26.09.2007 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | |||
|
XRD line profile analysis by total powder pattern fitting | 2005/2006 | Bachelor's thesis | FOF | prof. RNDr. Radomír Kužel, CSc. | 01.10.2005 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | ||
|
X-ray diffraction study of Ti-O-N thin films | 2006/2007 | Bachelor's thesis | prof. RNDr. Radomír Kužel, CSc. | 05.10.2006 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | |||
|
XRD line profile analysis by total powder pattern fitting | 2007/2008 | Bachelor's thesis | prof. RNDr. Radomír Kužel, CSc. | 26.09.2007 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | |||
|
Microstructure and properties of highly perturbed carbon based nanomaterials studied by X-ray scattering methods | 2017/2018 | dissertation | 4F13 | prof. RNDr. Radomír Kužel, CSc. | 25.03.2015 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | ||
|
XRD line profile analysis by total powder pattern fitting | 2008/2009 | Bachelor's thesis | F | prof. RNDr. Radomír Kužel, CSc. | 02.10.2008 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | ||
|
X-ray diffraction study of Ti-O-N thin films | 2008/2009 | Bachelor's thesis | prof. RNDr. Radomír Kužel, CSc. | 03.10.2008 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF | |||
|
XRD line profile analysis by total powder pattern fitting | 2006/2007 | Bachelor's thesis | F | prof. RNDr. Radomír Kužel, CSc. | 02.10.2006 | Ne | Katedra fyziky kondenzovaných látek (32-KFKL) | MFF |
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