Structure of submicrocrystalline materials studied by X-ray diffraction
| Thesis title in Czech: | Studium struktury submikrokrystalických materiálů pomocí rentgenové difrakce |
|---|---|
| Thesis title in English: | Structure of submicrocrystalline materials studied by X-ray diffraction |
| Key words: | rentgenová difrakce, modelování difrakčních profilů, mřížové poruchy, rozdělení velikostí krystalitů |
| English key words: | X-ray diffraction, diffraction profile modelling, lattice defects, crystallite size distribution |
| Academic year of topic announcement: | 2003/2004 |
| Thesis type: | dissertation |
| Thesis language: | angličtina |
| Department: | Department of Condensed Matter Physics (32-KFKL) |
| Supervisor: | prof. RNDr. Radomír Kužel, CSc. |
| Author: | hidden - assigned and confirmed by the Study Dept. |
| Date of registration: | 26.11.2003 |
| Date of assignment: | 26.11.2003 |
| Date and time of defence: | 15.09.2011 09:00 |
| Date of electronic submission: | 01.08.2011 |
| Date of submission of printed version: | 30.06.2011 |
| Date of proceeded defence: | 15.09.2011 |
| Opponents: | RNDr. Petr Lukáš, CSc. |
| Ing. Marian Čerňanský, CSc. | |